Tescan MIRA-3 Scanning Electron Microscope
The Tescan MIRA-3 scanning electron microscope with a high-brightness Schottky cathode allows you to obtain images with high contrast, resolution (up to 1.2 nm) and low noise.
Easy navigation through the sample is ensured by a compucentric stage of samples with precision reproduction of coordinates, fully motorized along all 5 axes.
A retractable cathodoluminescent radiation detector (panchromatic cathodoluminescent detector, wavelength ranges 185–850 nm) allows searching and determining parameters of inclusions, defects and grain boundaries in materials of various nature. An efficient light guide combined with a mirror system allows you to get high-quality CL images in a short time.
Scope: surface topography (including 3D), analysis of coatings, surface roughness and waviness, grain shape and size, pore analysis, morphological analysis, study of the origin and development of cracks, fractures and fracture centers, fatigue grooves, visualization of p-n junctions, study of the dislocation structure (CL detector).
Tin micro- and nanoparticles
ZnO nanoparticles
Image of a jewelry cut top in SE and CL detectors